Quantum calibrated magnetic force microscopy

verfasst von
Baha Sakar, Yan Liu, Sibylle Sievers, Volker Neu, Johannes Lang, Christian Osterkamp, Matthew L. Markham, Osman Öztürk, Fedor Jelezko, Hans W. Schumacher
Abstract

We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.

Externe Organisation(en)
Physikalisch-Technische Bundesanstalt (PTB)
Gebze Technical University
Beijing Academy of Quantum Information Sciences (BAQIS)
Universität Ulm
Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden (IFW) e.V.
Element Six Global Innovation Centre (GIC)
Typ
Artikel
Journal
Physical Review B
Band
104
ISSN
2469-9950
Publikationsdatum
01.12.2021
Publikationsstatus
Veröffentlicht
Peer-reviewed
Ja
ASJC Scopus Sachgebiete
Elektronische, optische und magnetische Materialien, Physik der kondensierten Materie
Elektronische Version(en)
https://doi.org/10.1103/PhysRevB.104.214427 (Zugang: Unbekannt)