Fabrication and Properties of Josephson Junction Cantilevers for Terahertz Applications

authored by: Ilya Elenskiy, Marco Tollkuhn, Denis Kajevic, Michael Martens, Benedikt Hampel, Meinhard Schilling
Abstract: Josephson cantilevers are employed to measure the three-dimensional radiation distribution at microwave frequencies and up to the terahertz regime. Epitaxial YBa₂Cu₃O₇ Josephson junctions with high I_cR_n products are required at these frequencies. The commonly used epitaxial Josephson junctions on LaAlO₃ bicrystal substrates fulfill these requirements but exhibit significant variance in their electronic properties. In addition, the substrate losses have to be minimized and, therefore, only substrate materials with low relative permittivity _r and loss tangent tan δ in the microwave regime are suitable. The fabrication is realized by optimized pulsed laser deposition of YBa₂Cu₃O₇. The separated devices are automatically characterized including the electric I-V curves and temperature dependence. In addition, the microwave properties are determined in our terahertz microscope at 762 GHz with a far infrared laser system and low-noise measurement electronics. The Josephson cantilevers are used to measure the spatial power distribution of the laser beam by differential resistance analysis and by Hilbert transform of the first Shapiro step. The latter approach shows a good agreement with the expected beam profile.
External Organisation(s): Technische Universität Braunschweig
Type: Article
Journal: IEEE Transactions on Applied Superconductivity
Volume: 29
ISSN: 1051-8223
Publication date: 08.2019
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Electrical and Electronic Engineering
Electronic version(s): https://doi.org/10.1109/tasc.2019.2900217 (Access: Closed)

BibTeX

@article{5f53c348f99948f9bc9beb733a49d2f0,
title = "Fabrication and Properties of Josephson Junction Cantilevers for Terahertz Applications",
abstract = "Josephson cantilevers are employed to measure the three-dimensional radiation distribution at microwave frequencies and up to the terahertz regime. Epitaxial YBa2Cu3O7 Josephson junctions with high IcRn products are required at these frequencies. The commonly used epitaxial Josephson junctions on LaAlO3 bicrystal substrates fulfill these requirements but exhibit significant variance in their electronic properties. In addition, the substrate losses have to be minimized and, therefore, only substrate materials with low relative permittivity r and loss tangent tan δ in the microwave regime are suitable. The fabrication is realized by optimized pulsed laser deposition of YBa2Cu3O7. The separated devices are automatically characterized including the electric I-V curves and temperature dependence. In addition, the microwave properties are determined in our terahertz microscope at 762 GHz with a far infrared laser system and low-noise measurement electronics. The Josephson cantilevers are used to measure the spatial power distribution of the laser beam by differential resistance analysis and by Hilbert transform of the first Shapiro step. The latter approach shows a good agreement with the expected beam profile.",
keywords = "Hilbert spectroscopy, Josephson junction, technology, Terahertz microscope, YBCO",
author = "Ilya Elenskiy and Marco Tollkuhn and Denis Kajevic and Michael Martens and Benedikt Hampel and Meinhard Schilling",
note = "Funding information: Manuscript received October 30, 2018; accepted February 13, 2019. Date of publication February 19, 2019; date of current version April 5, 2019. This work was supported in part by the Braunschweig International Graduate School of Metrology B-IGSM, in part by the DFG Research Training Group GrK 1952/1 “Metrology for Complex Nanosystems,” in part by the Laboratory for Emerging Nanometrology—LENA, in part by the Cluster of Excellence–Quantum Frontiers, and in part by the Young Researcher Program of MWK, Federal State of Lower Saxony, Germany. (Corresponding author: Ilya Elenskiy.) The authors are with the Institut f{\"u}r Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany (e-mail:, i.elenskiy@tu-bs.de; d.kajevic@tu-braunschweig.de).",
year = "2019",
month = aug,
doi = "10.1109/tasc.2019.2900217",
language = "English",
volume = "29",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",
}