Josephson cantilevers for THz microscopy of additive manufactured diffractive optical components

authored by
Benedikt Hampel, Marco Tollkuhn, Ilya Elenskiy, Michael Martens, Denis Kajevic, Meinhard Schilling

Josephson junctions can be employed as sensors to determine frequency and power of microwave and terahertz (THz) radiation. A Josephson cantilever carries at least one Josephson junction with an antenna structure to be sensitive for THz radiation. In our THz microscope, this cantilever is mounted on a 15 × 15 × 15 mm3 positioning system in vacuum and is cooled by a cryocooler to operating temperatures between 30 and 85 K. Current-voltage characteristics are measured at every spatial position. The frequency and power of THz radiation are derived from the electrical characteristics for every spatial point and three-dimensional visualizations of the power distribution are evaluated. The THz microscope represents a versatile measuring instrument to characterize many different microwave and THz circuits and components. In this paper, Josephson cantilevers fromYBa2Cu3O7 on LaAlO3 bicrystal substrates are employed to characterize additive manufactured diffraction gratings. The diffraction patterns of the gratings are measured and visualized with a far-infrared laser system at a frequency of 762 GHz. The obtained results are matching with calculations from a theoretical model. The presented method is capable of supporting fast prototyping processes for THz components by analyzing diffraction patterns three dimensionally.

External Organisation(s)
Technische Universität Braunschweig
IEEE Transactions on Applied Superconductivity
Publication date
Publication status
Peer reviewed
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Electrical and Electronic Engineering
Electronic version(s) (Access: Closed)